|
Model |
WK-5235 |
|
|
Frequency |
200KHz |
|
|
Test Parameter |
||
|
Transformer Scanning |
Turn Ratio, Phase, L, Q, Leakage L, Balance, |
|
|
ACR, Cp, D, X, Y, DCR, Pin Short |
||
|
Test Signals Information |
||
|
Test Frequency (0.01%, 5digits) |
Turn |
1kHz~200kHz |
|
Others |
20Hz~200kHz |
|
|
Output Impedance |
100Ω |
|
|
Measurement Range |
||
|
L, LK |
0.00001uH~9999.99H |
|
|
C |
0.00001pF~999.999mF |
|
|
Q, D |
0.00001~99999 |
|
|
Z, X, R |
0.00001Ω~99.9999MΩ |
|
|
Y |
0.01nS~99.9999S |
|
|
θ |
-90.00º~+90.00º |
|
|
DCR |
0.01mΩ~99.999MΩ |
|
|
Turn |
0.01~99999.99turns |
|
|
Pin-Short |
12 pairs, between pin to pin |
|
|
Basic Accuracy |
||
|
L, LK, C, Z, X, Y, R, DCR |
0.1% (1kHz if AC parameter) |
|
|
Q, D |
0.0005(1kHz) |
|
|
θ |
0.03º(1kHz) |
|
|
Turn |
0.5%(1kHz) |
|
|
Measurement Speed (Fastest) |
||
|
L, LK, C, Z, X, Y, R, D, θ |
75ms |
|
|
DCR |
30m/s |
|
|
Turn |
75ms |
|
|
Judge |
||
|
Transformer Scanning |
PASS/FAIL judge of all test parameters |
|
|
output from optional HANDLER interface |
||
|
Test Channel |
20 Channels |
|
|
Trigger |
Internal, Manual, External |
|
|
Display |
320*240 dot-matrix LCD display |
|
|
Equivalent Circuit Mode |
Series, Parallel |
|
|
Correction Function |
Open/Short Zeroing, Load deviation |
|
|
Memory |
64 instrument setups |
|
|
General |
40 Pin Test Fixture |
|
|
Operation Environment |
Temperature :10ºC ~ 40ºC, Humidity :10%~90% RH |
|
|
Power Consumption |
140VA max. |
|
|
Power Requirement |
90Vac~125Vac or 190Vac~250Vac, 48Hz~62Hz |
|
|
Weight |
Approx. 9kg |
|
|
Dimension (W*H*D) |
480*180*320mm |
|
英国Wanye Kerr WK-5235变压器测试机,咨询电话:0512-68551216/68551217/65090040